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	<title><![CDATA[agilent technologies inc. and integrated circuit Resources | BNET]]></title>
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	<description><![CDATA[White papers, case studies, business articles, and blog posts relating to agilent technologies inc. and integrated circuit]]></description>
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		<title><![CDATA[Agilent to open IC device modeling R&D center in China (Electronic News)]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_hb5934/is_200703/ai_n23909051]]></link>
		<description><![CDATA[To better serve the industry's leading semiconductor foundries and to respond to advancements in complementary metal-oxide-semiconductor CMOS modeling, Santa Clara, CA-based semiconductor test and measurement tool supplier Agilent Technologies Inc      To better serve the industry's leading semiconductor foundries and to respond to advancements in complementary...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Mon, 05 Mar 2007 00:00:00 -0800</pubDate>
		<category domain="http://resources.bnet.com/topic/agilent+technologies+inc..html"><![CDATA[Agilent Technologies Inc.]]></category>
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		<title><![CDATA[TRADE NEWS: Xi'an IC & Systems Design Center Selects Agilent Technologies 93000 SOC Series Test System; Purchase Helps Position Center as Leading SOC Test Facility in Northwest China]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2005_Oct_28/ai_n15758575]]></link>
		<description><![CDATA[PALO ALTO, Calif. -- Agilent Technologies Inc. (NYSE:A) today announced that the Xi'an IC & Systems Design Center has purchased an Agilent 93000 SOC Series system for testing high-speed applications and mixed-signal devices. The addition of the system will help to solidify the center as the leading SOC test facility...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Fri, 28 Oct 2005 00:00:00 -0700</pubDate>
		<category domain="http://resources.bnet.com/topic/agilent+technologies+inc..html"><![CDATA[Agilent Technologies Inc.]]></category>
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		<title><![CDATA[ProMOS Technologies Selects Agilent Technologies' Parametric Test Solution for 12-Inch IC Fabrication Plant]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2005_May_17/ai_n13722718]]></link>
		<description><![CDATA[PALO ALTO, Calif. -- Agilent 4072B Chosen to Perform High-Performance/High-Density DRAM Test]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Tue, 17 May 2005 00:00:00 -0700</pubDate>
		<category domain="http://resources.bnet.com/topic/agilent+technologies+inc..html"><![CDATA[Agilent Technologies Inc.]]></category>
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		<title><![CDATA[TRADE NEWS: Agilent Technologies Ships 4 Millionth Tachyon Fibre Channel Controller IC]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2004_Nov_17/ai_n6365864]]></link>
		<description><![CDATA[PALO ALTO, Calif. -- Industry's Most Widely Used Controller Increases Performance, Reduces Cost for Storage OEMs]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Wed, 17 Nov 2004 00:00:00 -0800</pubDate>
		<category domain="http://resources.bnet.com/topic/agilent+technologies+inc..html"><![CDATA[Agilent Technologies Inc.]]></category>
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		<title><![CDATA[TRADE NEWS: Agere Systems Selects Agilent Technologies' 93000 SOC Series Test System for Serial Attached SCSI Controller IC Development, Production Testing]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2004_August_31/ai_n6176945]]></link>
		<description><![CDATA[PALO ALTO, Calif. -- Storage IC Market Leader Turns to Scalable Agilent Platform for Complex Serial I/O Testing Needs at 3.0 Gb/s Data Rate]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Tue, 31 Aug 2004 00:00:00 -0700</pubDate>
		<category domain="http://resources.bnet.com/topic/agere+systems+inc..html"><![CDATA[Agere Systems Inc.]]></category>
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		<title><![CDATA[SMT millimeter-wave ICs for microwave radios through 20 GHz.(Microwave & RF Components)]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_hb4822/is_200408/ai_n17578376]]></link>
		<description><![CDATA[Agilent Technologies has introduced a series of millimeter-wave ICs  in a 5 mm X 5 mm SMT package compatible with automated assembly  techniques. This series is said to fill virtually all the active RF  requirements of point-to-point and point-to-multip  Agilent Technologies has introduced a series of...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Sun, 01 Aug 2004 00:00:00 -0700</pubDate>
		<category domain="http://resources.bnet.com/topic/agilent+technologies+inc..html"><![CDATA[Agilent Technologies Inc.]]></category>
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		<title><![CDATA[Haier selects Agilent Technologies' design-for-test software for China's first commercial set-top box ICs for digital TV.(Company News)(Haier (Beijing) IC Design Company Ltd)(Brief Article)]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_hb6531/is_200402/ai_n25885625]]></link>
		<description><![CDATA[Agilent Technologies Inc. announced that Haier Beijing IC Design  Company Ltd. has selected its SmarTest Program Generator design-for-test  software to reduce test time for China's first commercial set-top  box STB ICs for digital television. The Ag  Agilent Technologies Inc. announced that Haier Beijing IC Design ...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Sun, 01 Feb 2004 00:00:00 -0800</pubDate>
		<category domain="http://resources.bnet.com/topic/agilent+technologies+inc..html"><![CDATA[Agilent Technologies Inc.]]></category>
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		<title><![CDATA[AGILENT TECHNOLOGIES AIDS SZZK-ICDC WITH CHIP TESTING SOLUTIONS]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_hb5562/is_200309/ai_n22800998]]></link>
		<description><![CDATA[AsiaInfo Services    09-23-2003    Agilent Technologies Aids SZZK-ICDC with Chip Testing Solutions    CHINA, Sep 23, 2003 SinoCast via COMTEX -- On September 19, Agilent Technologies and SZZK-Integrated Circuit Designing Center (SZZK-ICDC) announced t  AsiaInfo Services    09-23-2003  ...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Tue, 23 Sep 2003 00:00:00 -0700</pubDate>
		<category domain="http://resources.bnet.com/topic/agilent+technologies+inc..html"><![CDATA[Agilent Technologies Inc.]]></category>
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		<title><![CDATA[Software tool makes short work of polyglot IP in SOC ICs.(Leading edge: what's hot in the design community)]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_hb4804/is_200308/ai_n17512422]]></link>
		<description><![CDATA[EEs WHO DESIGN TESTABILITY FEATURES into SOC (system-on-chip) ICs  and those who design verification and production-test programs for such  devices have to regard Agilent's SmarTest PG program generator  CTL (core-test language) Browser as a work in    EEs WHO DESIGN TESTABILITY FEATURES into SOC (system-on-chip)...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Thu, 21 Aug 2003 00:00:00 -0700</pubDate>
		<category domain="http://resources.bnet.com/topic/agilent+technologies+inc..html"><![CDATA[Agilent Technologies Inc.]]></category>
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		<title><![CDATA[Agilent&#39;s RF/mixed signal IC design flow chosen]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_qa5368/is_200307/ai_n21334048]]></link>
		<description><![CDATA[To develop its new RF/mixed signal IC design flow, Agere Systems has selected the Agilent RF Design Environment RFDE. ]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Tue, 01 Jul 2003 00:00:00 -0700</pubDate>
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