<![CDATA[Keithley Instruments Inc. | Company News & Executive Profiles - KEI | BNET]]> en-us <![CDATA[Keithley Adds WiMAX Testing Capability to Its RF Test Instrument Family]]> Tue, 17 Jun 2008 23:59:59 -0700 KEI KEI <![CDATA[Keithley and Azimuth Systems Announce Collaboration to Create LTE, WiMAX RF Testing Solutions]]> Mon, 16 Jun 2008 23:59:59 -0700 KEI KEI <![CDATA[Keithley and Azimuth Systems Announce Collaboration to Create LTE, WiMAX RF Testing Solutions]]> Mon, 16 Jun 2008 00:00:00 -0700 KEI KEI <![CDATA[Keithley ACS Version 3.2 Offers New Parallel Test and Parametric Die Sort Features for Higher Throughput]]> Thu, 10 Jan 2008 00:00:00 -0800 KEI KEI <![CDATA[Keithley's German Service Center Joins List of ISO 17025 Accredited Laboratories]]> Mon, 01 Oct 2007 23:59:59 -0700 KEI KEI <![CDATA[Keithley Launches Integrated Test Systems for Faster and Easier Semiconductor Testing]]> Thu, 12 Apr 2007 00:00:00 -0700 KEI KEI <![CDATA[Keithley Recognized for Outstanding Customer Satisfaction in Semiconductor Industry]]> Wed, 31 Jan 2007 00:00:00 -0800 KEI KEI <![CDATA[Keithley Introduces Fast, Flexible Vector Signal Analyzer]]> Tue, 31 Oct 2006 00:00:00 -0800 KEI KEI <![CDATA[Keithley's Metrology Services Earns Rigorous ISO 17025 Accreditation]]> Thu, 07 Sep 2006 00:00:00 -0700 KEI KEI <![CDATA[Keithley Series 2600 System SourceMeter® Instruments Cited Among World's Top 100 Technologies of 2006]]> Tue, 01 Aug 2006 00:00:00 -0700 KEI KEI