<?xml version="1.0" encoding="iso-8859-1" ?>
<rss version="2.0" xmlns:s="http://resources.bnet.com/">
<channel>
	<title><![CDATA[vlsi Resources | BNET]]></title>
	<link><![CDATA[http://resources.bnet.com/topic/vlsi.html]]></link>
	<description><![CDATA[White papers, case studies, business articles, and blog posts relating to vlsi]]></description>
	<s:counts start="0" returned="20" found="132" />
	<language>en-us</language>
	<item>
		<title><![CDATA[University of Virginia Students Use ClioSoft Design Data Management Suite for VLSI Design Projects]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2008_Feb_19/ai_n24267017]]></link>
		<description><![CDATA[FREMONT, Calif. -- ClioSoft, Inc., supplier of the leading design data management suite for hardware and software developers, today announced that they have donated fifty SOS viaDFII[TM] licenses to the University of Virginia (U.Va.) School of Engineering and Applied Science's Department of Electrical and Computer Engineering for educational purposes. ClioSoft...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Tue, 19 Feb 2008 00:00:00 -0800</pubDate>
		<category domain="http://resources.bnet.com/topic/data+management.html"><![CDATA[data management]]></category>
		<category domain="http://resources.bnet.com/topic/university+of+virginia.html"><![CDATA[University of Virginia]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/.html"><![CDATA[]]></category>
	</item>
	<item>
		<title><![CDATA[Teradyne Named to VLSI Research "10 BEST" List for 19th Straight Year]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2007_June_25/ai_n27286645]]></link>
		<description><![CDATA[NORTH READING, Mass. -- Teradyne, Inc. (NYSE: TER), a world leader in high efficiency, low-cost test, was named a '10 BEST' supplier in the annual VLSI Research Customer Satisfaction survey for the 19th consecutive year. Semiconductor equipment users from around the world recognized Teradyne as a top ranked Automatic Test...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Mon, 25 Jun 2007 00:00:00 -0700</pubDate>
		<category domain="http://resources.bnet.com/topic/teradyne+inc..html"><![CDATA[Teradyne Inc.]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/.html"><![CDATA[]]></category>
		<category domain="http://rss.financialcontent.com/stocksymbol">TER</category>
		<category domain="tickers">TER</category>
	</item>
	<item>
		<title><![CDATA[Test Industry's Leading Technical Forum Celebrates 25th Anniversary]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2007_May_3/ai_n27226465]]></link>
		<description><![CDATA[2007 VLSI Test Symposium will be held in Berkeley, CA, from May 6th to 10th, 2007  AMISSVILLE, Va. -- The IEEE VLSI Test Symposium, a leading test industry technical event, celebrates its 25th anniversary next week, from May 6th to May 10th in Berkeley, California. The 2007 edition of...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Thu, 03 May 2007 23:59:59 -0700</pubDate>
		<category domain="http://resources.bnet.com/topic/computer+associates+international+inc..html"><![CDATA[Computer Associates International Inc.]]></category>
		<category domain="http://resources.bnet.com/topic/hardware.html"><![CDATA[HARDWARE]]></category>
		<category domain="http://resources.bnet.com/topic/ieee.html"><![CDATA[IEEE]]></category>
		<category domain="http://resources.bnet.com/topic/semiconductors.html"><![CDATA[Semiconductors]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
	</item>
	<item>
		<title><![CDATA[End Users' Cost-saving Measures Increase Outsourcing Revenues for Asian VLSI Vendors]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2007_Jan_4/ai_n27104627]]></link>
		<description><![CDATA[DUBLIN, Ireland -- Research and Markets (http://www.researchandmarkets.com/reports/c47815) has announced the addition of Frost & Sullivan's new report: World VLSI Design Services Market to their offering.  This Frost & Sullivan research service titled World VLSI Design Services Market provides forecast by geographic regions and analysis of the drivers, restraints, and...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Thu, 04 Jan 2007 23:59:59 -0800</pubDate>
		<category domain="http://resources.bnet.com/topic/asics.html"><![CDATA[ASICs]]></category>
		<category domain="http://resources.bnet.com/topic/frost+%2526+sullivan.html"><![CDATA[Frost & Sullivan]]></category>
		<category domain="http://resources.bnet.com/topic/hardware.html"><![CDATA[HARDWARE]]></category>
		<category domain="http://resources.bnet.com/topic/outsourcing.html"><![CDATA[outsourcing]]></category>
		<category domain="http://resources.bnet.com/topic/semiconductors.html"><![CDATA[Semiconductors]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/.html"><![CDATA[]]></category>
	</item>
	<item>
		<title><![CDATA[Teradyne Receives Five Star Rating from VLSI Research]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2006_Dec_20/ai_n27091730]]></link>
		<description><![CDATA[Supplier Ratings Derived from Customer Satisfaction Survey]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Wed, 20 Dec 2006 00:00:00 -0800</pubDate>
		<category domain="http://resources.bnet.com/topic/teradyne+inc..html"><![CDATA[Teradyne Inc.]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/.html"><![CDATA[]]></category>
		<category domain="http://rss.financialcontent.com/stocksymbol">TER</category>
		<category domain="tickers">TER</category>
	</item>
	<item>
		<title><![CDATA[Wipro Selects Cadence as Primary Vendor for VLSI and System Design Solutions]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_pwwi/is_200612/ai_n16886117]]></link>
		<description><![CDATA[Cadence Design Systems India Pvt Ltd., the Indian subsidiary of Cadence Design Systems, Inc. (NASDAQ: CDNS) today announced that Wipro Technologies, the global IT services division of Wipro Limited (NYSE: WIT) and also the world's largest independent R&D services provider, has chosen Cadence for its VLSI and System Design services...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Wed, 13 Dec 2006 00:00:00 -0800</pubDate>
		<category domain="http://resources.bnet.com/topic/cadence+design+systems+inc..html"><![CDATA[Cadence Design Systems Inc.]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/wipro+technologies.html"><![CDATA[Wipro Technologies]]></category>
		<category domain="http://resources.bnet.com/topic/.html"><![CDATA[]]></category>
		<category domain="http://rss.financialcontent.com/stocksymbol">CDNS</category>
		<category domain="tickers">CDNS</category>
	</item>
	<item>
		<title><![CDATA[TRADE NEWS: Agilent Ranked No. 1 in Process Diagnostics Equipment on VLSI Research ''10 BEST'' List]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2006_August_16/ai_n26960253]]></link>
		<description><![CDATA[PALO ALTO, Calif. -- Agilent Technologies Inc. (NYSE:A) today announced that it has been recognized by customers as the best supplier in the Process Diagnostics Equipment category for its family of parametric test solutions in the VLSI Research 2006 "10 BEST" Awards. Agilent received the highest overall process diagnostics rating...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Wed, 16 Aug 2006 00:00:00 -0700</pubDate>
		<category domain="http://resources.bnet.com/topic/agilent+technologies+inc..html"><![CDATA[Agilent Technologies Inc.]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/.html"><![CDATA[]]></category>
		<category domain="http://rss.financialcontent.com/stocksymbol">A</category>
		<category domain="tickers">A</category>
	</item>
	<item>
		<title><![CDATA[ATE Consumers Again Rate Teradyne as '10 BEST' Supplier in VLSI Research 2006 Customer Survey]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2006_June_27/ai_n26908642]]></link>
		<description><![CDATA[BOSTON -- Teradyne, Inc. (NYSE: TER) was recognized for the 18th consecutive year as a '10 BEST' supplier in the annual VLSI Research Customer Satisfaction survey. Semiconductor equipment users from around the world ranked Teradyne in the 2006 '10 BEST Suppliers of Test Equipment' and as the top ranked Automatic...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Tue, 27 Jun 2006 00:00:00 -0700</pubDate>
		<category domain="http://resources.bnet.com/topic/supplier.html"><![CDATA[supplier]]></category>
		<category domain="http://resources.bnet.com/topic/teradyne+inc..html"><![CDATA[Teradyne Inc.]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/.html"><![CDATA[]]></category>
		<category domain="http://rss.financialcontent.com/stocksymbol">TER</category>
		<category domain="tickers">TER</category>
	</item>
	<item>
		<title><![CDATA[Test Industry's Leading Technical Forum to Address Emerging Trends in Manufacturing Test; IEEE 2006 VLSI Test Symposium will be held in Berkeley, CA, April 30th - May 4th, 2006]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2006_April_17/ai_n16125949]]></link>
		<description><![CDATA[AMISSVILLE, Va. -- The 24th IEEE VLSI Test Symposium, a leading test industry technical event, announced a strong technical program designed to address key challenges in the design-for-test, manufacturing test, and validation of integrated circuits and systems, scheduled for April 30th to May 4th in Berkeley, California. The VTS 2006...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Mon, 17 Apr 2006 00:00:00 -0700</pubDate>
		<category domain="http://resources.bnet.com/topic/ieee.html"><![CDATA[IEEE]]></category>
		<category domain="http://resources.bnet.com/topic/manufacturing.html"><![CDATA[manufacturing]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/computer+associates+international+inc..html"><![CDATA[Computer Associates International Inc.]]></category>
	</item>
	<item>
		<title><![CDATA[Fairchild Semiconductor Director Authors Book on Managing Power Electronics; Dr. Nazzareno Rossetti's ''Managing Power Electronics: VLSI and DSP-Driven Computer Systems'' Published by Wiley]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2006_Jan_10/ai_n26722488]]></link>
		<description><![CDATA[SOUTH PORTLAND, Maine -- -Fairchild Semiconductor (NYSE: FCS), the leading global supplier of high performance products that optimize system power, today announced that Dr. Nazzareno Rossetti, senior director, Strategy, Analog Product Group, has authored a new book on managing power electronics.]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Tue, 10 Jan 2006 00:00:00 -0800</pubDate>
		<category domain="http://resources.bnet.com/topic/electronics.html"><![CDATA[electronics]]></category>
		<category domain="http://resources.bnet.com/topic/fairchild+semiconductor+corp..html"><![CDATA[Fairchild Semiconductor Corp.]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/.html"><![CDATA[]]></category>
	</item>
	<item>
		<title><![CDATA[Sequence Showcases Low-Power Design Expertise at India's VLSI Design Conference]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2005_Dec_9/ai_n15927619]]></link>
		<description><![CDATA[SANTA CLARA, Calif. -- Sequence Design, the EDA technology leader in low-power design, returns as an exhibitor for next month's VLSI Design Conference Jan. 3-7, 2006 in Hyderabad, India, Booth No. 21. The conference theme, "Mobile Embedded Systems," ties in perfectly with Sequence's show offerings that excel in managing and...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Fri, 09 Dec 2005 00:00:00 -0800</pubDate>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/.html"><![CDATA[]]></category>
	</item>
	<item>
		<title><![CDATA[New FormFactor Probe Solution Dramatically Increases System-on-Chip Flip Chip Test Throughput; Wafer Test Device Debuts at Institute of Electrical and Electronics Engineers Conference on Very Large Scale Integration &#151; VLSI &#151; Test Performance]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2005_May_4/ai_n13672372]]></link>
		<description><![CDATA[LIVERMORE, Calif. -- FormFactor, Inc. (Nasdaq:FORM) today announced delivery of it's latest product for enabling breakthrough wafer test performance and throughput in the emerging System-on-Chip SoC flip chip market. FormFactor, a leading provider of advanced wafer probe cards, introduced the FormFactor BladeRunnerTM175 (BR175) Multi-DUT Device Under Test wafer probe card...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Wed, 04 May 2005 00:00:00 -0700</pubDate>
		<category domain="http://resources.bnet.com/topic/chip.html"><![CDATA[chip]]></category>
		<category domain="http://resources.bnet.com/topic/ieee.html"><![CDATA[IEEE]]></category>
		<category domain="http://resources.bnet.com/topic/performance.html"><![CDATA[performance]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/wafer.html"><![CDATA[wafer]]></category>
		<category domain="http://resources.bnet.com/topic/.html"><![CDATA[]]></category>
	</item>
	<item>
		<title><![CDATA[Jasper Design Automation Forms Formal Verification Technical Advisory Board]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2005_Jan_12/ai_n8689308]]></link>
		<description><![CDATA[MOUNTAIN VIEW, Calif. -- Design Verification Visionaries to Provide Research Insights and Experience to Jasper Management  Jasper Design Automation, provider of breakthrough high-level formal verification solutions, today announced that it has formed a Technical Advisory Board TAB made up of world-renowned visionaries from the academic world in the field...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Wed, 12 Jan 2005 23:59:59 -0800</pubDate>
		<category domain="http://resources.bnet.com/topic/automation.html"><![CDATA[automation]]></category>
		<category domain="http://resources.bnet.com/topic/cad.html"><![CDATA[CAD]]></category>
		<category domain="http://resources.bnet.com/topic/dr..html"><![CDATA[Dr.]]></category>
		<category domain="http://resources.bnet.com/topic/hardware.html"><![CDATA[HARDWARE]]></category>
		<category domain="http://resources.bnet.com/topic/ieee.html"><![CDATA[IEEE]]></category>
		<category domain="http://resources.bnet.com/topic/productivity.html"><![CDATA[PRODUCTIVITY]]></category>
		<category domain="http://resources.bnet.com/topic/professor.html"><![CDATA[professor]]></category>
		<category domain="http://resources.bnet.com/topic/semiconductors.html"><![CDATA[Semiconductors]]></category>
		<category domain="http://resources.bnet.com/topic/software.html"><![CDATA[SOFTWARE]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/.html"><![CDATA[]]></category>
	</item>
	<item>
		<title><![CDATA[Sequence Next-Generation Tools for Low-Power Design Highlight India's VLSI Design 2005 Conference Jan. 3-5; Ties to Conference Theme of ''Power-Aware Design of VLSI Systems'']]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2004_Dec_22/ai_n8583242]]></link>
		<description><![CDATA[SANTA CLARA, Calif. -- Sequence Design, the EDA accuracy and performance leader in power integrity, is using the upcoming VLSI Design 2005 Conference in Kolkata, India to once again demonstrate its technology leadership in low-power design tools and techniques for the emerging chip design applications in portable computing, handheld games,...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Wed, 22 Dec 2004 00:00:00 -0800</pubDate>
		<category domain="http://resources.bnet.com/topic/aware.html"><![CDATA[Aware]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/.html"><![CDATA[]]></category>
		<category domain="http://rss.financialcontent.com/stocksymbol">AWRE</category>
		<category domain="tickers">AWRE</category>
	</item>
	<item>
		<title><![CDATA[CoWare to Showcase Leading Solutions for Electronic System-Level &#151;ESL&#151; Design at VLSI Design 2005 & ICES Conference in Kolkata, India, Jan. 3-5, 2005]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2004_Dec_20/ai_n8578401]]></link>
		<description><![CDATA[SAN JOSE, Calif. -- CoWare President and CEO, Alan Naumann, to Deliver Keynote Address]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Mon, 20 Dec 2004 00:00:00 -0800</pubDate>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/.html"><![CDATA[]]></category>
	</item>
	<item>
		<title><![CDATA[Core Competencies and Specialization Key to Survival in VLSI Design Services Market]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2004_Oct_19/ai_n6242232]]></link>
		<description><![CDATA[PALO ALTO, Calif. -- The increased need to focus on core competencies has led to amplified specialization in the very large scale integration VLSI design services market, fueling the trend of partnerships between semiconductor vendors and third-party design houses. This increased emphasis on specialization has led to the shortening of...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Tue, 19 Oct 2004 23:59:59 -0700</pubDate>
		<category domain="http://resources.bnet.com/topic/frost+%2526+sullivan.html"><![CDATA[Frost & Sullivan]]></category>
		<category domain="http://resources.bnet.com/topic/hardware.html"><![CDATA[HARDWARE]]></category>
		<category domain="http://resources.bnet.com/topic/semiconductors.html"><![CDATA[Semiconductors]]></category>
		<category domain="http://resources.bnet.com/topic/strategy.html"><![CDATA[Strategy]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
	</item>
	<item>
		<title><![CDATA[Teradyne Places in '10 BEST' Suppliers for VLSI Research 2004 Survey]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_m0EIN/is_2004_July_14/ai_n6105257]]></link>
		<description><![CDATA[BOSTON -- Teradyne, Inc. (NYSE:TER) was recognized as a "10 BEST Supplier" in two segments of the VLSI Research 2004 customer satisfaction survey based on scoring by semiconductor equipment users worldwide. Teradyne earned "10 BEST" awards for "Test & Material Handling Equipment" and for "Large Suppliers of Chip Making Equipment."...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Wed, 14 Jul 2004 00:00:00 -0700</pubDate>
		<category domain="http://resources.bnet.com/topic/supplier.html"><![CDATA[supplier]]></category>
		<category domain="http://resources.bnet.com/topic/teradyne+inc..html"><![CDATA[Teradyne Inc.]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/.html"><![CDATA[]]></category>
		<category domain="http://rss.financialcontent.com/stocksymbol">TER</category>
		<category domain="tickers">TER</category>
	</item>
	<item>
		<title><![CDATA[Samsung Selects TranSwitch As Preferred VLSI Component Supplier for W-CDMA Wireless Platform]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_hb5596/is_200403/ai_n23579977]]></link>
		<description><![CDATA[TranSwitch Corporation announced that Samsung Electronics Co., Ltd.'s Telecommunication Systems Division has selected TranSwitch's patented CellBus technology as well as CUBITPro and CUBIT-3 switching devices for Samsung's W-CDMA and 3G-CDMA wireless platTranSwitch Corporation announced that Samsung Electronics Co., Ltd.'s Telecommunication Systems Division has selected TranSwitch's patented CellBus technology as well...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Mon, 01 Mar 2004 00:00:00 -0800</pubDate>
		<category domain="http://resources.bnet.com/topic/samsung+electronics+co.+ltd..html"><![CDATA[Samsung Electronics Co. Ltd.]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/w-cdma.html"><![CDATA[W-CDMA]]></category>
		<category domain="http://resources.bnet.com/topic/.html"><![CDATA[]]></category>
		<category domain="http://rss.financialcontent.com/stocksymbol">SEC</category>
		<category domain="tickers">SEC</category>
	</item>
	<item>
		<title><![CDATA[Review and future prospects of low-voltage RAM circuits]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_qa3751/is_200309/ai_n9248828]]></link>
		<description><![CDATA[This paper describes low-voltage random-access memory RAM cells and peripheral circuits for standalone and embedded RAMs, focusing on stable operation and reduced subthreshold current in standby and active modes. First, technology trends in low-voltage dynamic RAMs DRAMs and static RAMs SRAMs are reviewed and the challenges of low-voltage RAMs in...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Mon, 01 Sep 2003 23:59:59 -0700</pubDate>
		<category domain="http://resources.bnet.com/topic/cell.html"><![CDATA[cell]]></category>
		<category domain="http://resources.bnet.com/topic/cmos.html"><![CDATA[CMOS]]></category>
		<category domain="http://resources.bnet.com/topic/components.html"><![CDATA[Components]]></category>
		<category domain="http://resources.bnet.com/topic/delta.html"><![CDATA[Delta]]></category>
		<category domain="http://resources.bnet.com/topic/dram.html"><![CDATA[DRAM]]></category>
		<category domain="http://resources.bnet.com/topic/hardware.html"><![CDATA[HARDWARE]]></category>
		<category domain="http://resources.bnet.com/topic/ieee.html"><![CDATA[IEEE]]></category>
		<category domain="http://resources.bnet.com/topic/memory.html"><![CDATA[Memory]]></category>
		<category domain="http://resources.bnet.com/topic/ram.html"><![CDATA[RAM]]></category>
		<category domain="http://resources.bnet.com/topic/semiconductors.html"><![CDATA[Semiconductors]]></category>
		<category domain="http://resources.bnet.com/topic/sram.html"><![CDATA[SRAM]]></category>
		<category domain="http://resources.bnet.com/topic/substrate.html"><![CDATA[substrate]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/.html"><![CDATA[]]></category>
	</item>
	<item>
		<title><![CDATA[Application of an SOI 0.12-5m CMOS technology to SoCs with low-power and high-frequency circuits]]></title>
		<link><![CDATA[http://findarticles.com/p/articles/mi_qa3751/is_200309/ai_n9248870]]></link>
		<description><![CDATA[Systems-on-chips SoCs that combine digital and high-speed communication circuits present new opportunities for power-saving designs. This results from both the large number of system specifications that can be traded off to minimize overall power and the inherent low capacitance of densely integrated devices. As shown in this paper, aggressively scaled...]]></description>
		<s:doctype><![CDATA[Research articles]]></s:doctype>
		<pubDate>Mon, 01 Sep 2003 23:59:59 -0700</pubDate>
		<category domain="http://resources.bnet.com/topic/capacitance.html"><![CDATA[capacitance]]></category>
		<category domain="http://resources.bnet.com/topic/capacitor.html"><![CDATA[capacitor]]></category>
		<category domain="http://resources.bnet.com/topic/cmos.html"><![CDATA[CMOS]]></category>
		<category domain="http://resources.bnet.com/topic/dr..html"><![CDATA[Dr.]]></category>
		<category domain="http://resources.bnet.com/topic/high-performance.html"><![CDATA[high-performance]]></category>
		<category domain="http://resources.bnet.com/topic/ibm+corp..html"><![CDATA[IBM Corp.]]></category>
		<category domain="http://resources.bnet.com/topic/ieee.html"><![CDATA[IEEE]]></category>
		<category domain="http://resources.bnet.com/topic/integration.html"><![CDATA[integration]]></category>
		<category domain="http://resources.bnet.com/topic/omega.html"><![CDATA[Omega]]></category>
		<category domain="http://resources.bnet.com/topic/performance.html"><![CDATA[performance]]></category>
		<category domain="http://resources.bnet.com/topic/radio.html"><![CDATA[radio]]></category>
		<category domain="http://resources.bnet.com/topic/substrate.html"><![CDATA[substrate]]></category>
		<category domain="http://resources.bnet.com/topic/technology.html"><![CDATA[technology]]></category>
		<category domain="http://resources.bnet.com/topic/transistor.html"><![CDATA[transistor]]></category>
		<category domain="http://resources.bnet.com/topic/vlsi.html"><![CDATA[VLSI]]></category>
		<category domain="http://resources.bnet.com/topic/.html"><![CDATA[]]></category>
		<category domain="http://rss.financialcontent.com/stocksymbol">IBM</category>
		<category domain="tickers">IBM</category>
	</item>
</channel>
</rss>
